MSA
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A Measurement System Analysis, abbreviated MSA, is a specially designed experiment that seeks to identify the components of variation in the measurement.
Just as processes that produce a product may vary, the process of obtaining measurements and data may have variation and produce defects. A Measurement Systems Analysis evaluates the test method, measuring instruments, and the entire process of obtaining measurements to ensure the integrity of data used for analysis (usually quality analysis) and to understand the implications of measurement error for decisions made about a product or process. MSA is an important element of Six Sigma methodology and of other quality management systems.
MSA analyzes the collection of equipment, operations, procedures, software and personnel that affects the assignment of a number to a measurement characteristic.
A Measurement Systems Analysis considers the following:
Selecting the correct measurement and approach
Assessing the measuring device
Assessing procedures & operators
Assessing any measurement interactions
Calculating the measurement uncertainty of individual measurement devices and/or measurement systems
Common tools and techniques of Measurement Systems Analysis include: calibration studies, fixed effect ANOVA, components of variance, Attribute Gage Study, Gage R&R, ANOVA Gage R&R, Destructive Testing Analysis and others. The tool selected is usually determined by characteristics of the measurement system itself.
Factors affecting measurement systems
Factors might include:
Equipment: measuring instrument, calibration, fixturing, etc
People: operators, training, education, skill, care
Process: test method, specification
Samples: materials, items to be tested (sometimes called "parts"), sampling plan, sample preparation, etc
Environment: temperature, humidity, conditioning, pre-conditioning,
Management: training programs, metrology system, support of people, support of quality management system, etc
These can be plotted in a "fishbone" Ishikawa diagram to help identify potential sources of measurment variation.